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Foreign matter inspection apparatus and foreign matter inspection method
 
   
Document Number
US Patent 7589833
Issued Date
September 15, 2009
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Abstract
A foreign-matter inspection apparatus is implemented which allows the stable detection sensitivity to be maintained. A laser beam emitted from a laser apparatus is applied to a beam irradiation sample via an irradiation unit and a mirror. Then, the laser beam is captured into a beam-capturing camera via an image-forming lens and a beam-direction switching mirror. Based on the captured beam image, an image computational processing unit judges inclination of the laser beam, then adjusting the irradiation unit thereby to correct the inclination of the laser beam. Also, the beam is captured into the beam-capturing camera in specified number-of-times while focus of the laser beam is being changed by an arbitrary amount by the irradiation unit. Based on the captured beam, the focus of the laser beam is corrected by adjusting the irradiation unit.
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Number of Claims:
18
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Published
September 15, 2009
Application Number
11/907,436
Filed
October 12, 2007
US Classification
356/237.2  
Int'l Classification
G01N   21/00   (20060101)  
Examiner
Attorney/Law Firm
Priority Data
Oct 16, 2006 [JP] 2006-281699
USPTO Field of Search
356/237.2  
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