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Semiconductor integrated circuit device and method of testing the same



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Document Number
US Patent 7002232
Issued Date
February 21, 2006
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Abstract
A semiconductor integrated circuit device includes a semiconductor substrate of a first conductive type, a first well of a second conductive type provided in the semiconductor substrate, a second well of the first conductive type provided in the first well, a third well of the second conductive type provided in the semiconductor substrate, a fourth well of the first conductive type provided in the third well, semiconductor elements constructing a first functional integrated circuit provided in the first and second wells, semiconductor elements constructing a second functional integrated circuit provided in the third and fourth wells, and an internal power source voltage generating circuit provided in the first well. The internal power source voltage generating circuit configured to generate a first internal power source voltage is applied to the first functional integrated circuit and a second internal power source voltage is applied to the second functional integrated circuit.
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Number of Claims:
10
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Published
February 21, 2006
Application Number
10/829,320
Filed
April 21, 2004
US Classification
257/499   257/355 257/500 257/E21.645 257/E27.081
Int'l Classification
H01L   29/00   (20060101)   H01L   27/01   (20060101)   H01L   27/12   (20060101)   H01L   31/0392   (20060101)  
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Parent Case
This is a continuation of application Ser. No. 09/511,620 filed Feb. 23, 2000, now U.S. Pat. No. 6,750,527, which is a continuation of Ser. No. 08/865,371 filed May 29, 1997, which is now a U.S. Pat. No. 6,055,655 issued Apr. 25, 2000, of which application is hereby incorporated by reference in its entirety.
Priority Data
May 30, 1996 [JP] 8-136892 May 01, 1997 [JP] 9-113900
USPTO Field of Search
257/499   257/500   257/501   257/502   257/503   257/504   257/505   257/506  
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