A weight measuring device comprises a load detecting section for constantly detecting a load value (W) of a sample placed on a measuring pan; a moving average processing section for calculating a moving average (Wa) of the detected load value (W); a load changing rate calculating section for calculating a load changing rate per unit time (Wb) of the detected load value (W); a storage section for storing a first load change threshold (Wr1), a second load change threshold (Wr2) which is smaller th...

A sensor network controller (4) includes: a sensor interface (44) receiving sensing data transmitted from sensors (5); a data write section (150) writing the received sensing data and sensing time information indicating a sensing time of the sensing data in association with each other to a memory section (42); the memory section (42) storing the sensing data and the sensing time information; a first data processing section (144) generating sensing data which is at the timing designated by a clie...

A system and method provides data for a laser projection process used in manufacturing involving fasteners. For example, the laser projection process may include projecting a laser image associated with fasteners used to assemble objects. Fastener attribute data may be extracted from an engineer's design data and processed to generate a laser projection output file. This output file may include geometric data used to project a laser image associated with the fasteners. For example, this image ma...

An apparatus, system, and method for measuring parameters, measuring or determining capacitance, producing a digital output that is dependent upon a capacitance, or converting a variable capacitance output, of a sensor capacitor for example, into a digital format. By activating and deactivating pins, a microprocessor may form various circuits, for instance, each containing a resistor and a different capacitor and, in some embodiments, without the use of intermediate switching components. The mic...

The present invention relates to a method for measuring a quantity of usage of a CPU, in particular to a method for measuring a quantity of usage of a CPU which is capable of getting a credible quantity of usage of a CPU without amending an algorithm in order to adapt it to the an operating system, e.g., MS-Windows System, or requiring a complicated code. The method uses various algorithms provided by the operating system on the behalf of a registry storing a quantity of usage of a CPU inside a ...

The present invention generates a visual display of metabolomic data compiled by a database and associated processor. More particularly, the present invention provides a database for automatically receiving a three-dimensional spectrometry data set for a group of samples. The present invention also provides a processor device for manipulating the data sets to produce plots that are directly comparable to a plurality of characteristic plots corresponding to a plurality of selected metabolites. Fu...

A method for identifying an operational phase of a motor may include obtaining a first value of a signal that is indicative of the operational phase of the motor and obtaining a second value of the signal after a period of time has expired. The method further includes identifying a first operational phase of the motor if the second value exceeds the first value by a non-negative first threshold value. A second operational phase of the motor is identified if the second value does not exceed the f...

The present invention provides systems and methods for performing frequency margin testing of a computer system, such as a server. A system of the invention can include a controller, e.g., a BMC, internal to the computer system and a digital frequency synthesizer that can communicate with the controller and can apply clock frequency to marginable components of the computer system. In response to commands from the controller, the synthesizer generates one or more test frequencies that are applied...

Embodiments herein present a method for automated simulation testbench generation for serializer/deserializer datapath systems. The method provides a database of transactors for generating and checking data within the datapath system, wherein the transactors are adaptable to arbitrary configurations of the datapath system. The database is provided with a single set of transactors per core. Next, the method automatically selects one set of transactors from the database for inclusion into the simu...

Specific wavelengths to use in optical metrology of an integrated circuit can be selected using one or more selection criteria and termination criteria. Wavelengths are selected using the selection criteria, and the selection of wavelengths is iterated until the termination criteria are met.