In a displacement measurement apparatus using light interference, a probe light path is spatially separated from a reference light path. Therefore, when a temperature or refractive index distribution by a fluctuation of air or the like, or a mechanical vibration is generated, an optical path difference fluctuates between both of the optical paths, and a measurement error is generated. In the solution, an optical axis of probe light is brought close to that of reference light by a distance which ...

A device for cutting and folding back a portion of a page along a peripheral edge to form a tab that extends beyond the peripheral edge. The device includes a first and second planar member and a folded over cutting blade positioned to extend laterally over the second member and partially over the first member. The folded over cutting blade forms two cutting edges and having an opening therebetween for receiving a portion of the page. In another aspect, the device includes a housing having an up...

An interferometer that includes a first beam-splitting surface positioned to separate an input beam into a first beam and a second beam. A first set of optics is positioned to receive the first beam, direct it to contact a first reflector multiple times and produce a first intermediate beam. The first intermediate beam follows a nominal output path when the first reflector has a first alignment normal to the first beam prior to reflection by the first reflector. The first set of optics includes ...

An interferometer for receiving a measurement beam from a target location on a stage of a semiconductor lithography machine and a reference beam from a reference location separated from the target location by a separation distance. The interferometer has a reference path to be traversed by the reference beam within the interferometer and a measurement path to be traversed by the measurement beam within the interferometer. Both the measurement path and the reference path are at least as long as t...

Arranged on both sides of a thin plate are optical displacement gauges that irradiate measurement lights onto surfaces of the thin plate and receive the measurement lights reflected by the surface so as to measure displacements of the surfaces of the thin plate. Variation of thickness of the thin plate is obtained on the basis of the displacements of the surfaces of the thin plate measured by each of the optical displacement gauges. Each of the optical displacement gauges detects the displacemen...

An interferometer or an interference position measuring device is constituted so that a low coherency light source (multi-mode semiconductor layer) or a plurality of light sources with different wavelengths are used as a light source, a light flux is split into two light fluxes in a light transmitting member, one light flux (reference light flux) is emitted to a reference mirror fixed to an optical head, and the other light flux is emitted to an object to be measured which moves or displaces, th...

Polarization interferometric architectures, preferably plane mirror types, having first and second measurement legs are provided with retardation elements, preferably, at least one set of split waveplates, comprised of two segments, tilted slightly (e.g., 2 mrad) in opposite directions with respect to each other to reduce the effects of undesirable ghost beams that otherwise would travel along the same path as the principal beams to produce significant cyclic errors. With the use of the split wa...

A polarising double-passed interferometer comprises a polarising beamsplitter (16), a reference mirror (20) in the path of a reference beam (14) and a movable measurement mirror (26) in the path of a measurement beam (12). The reference and measurement beams have different polarisations. An angular beam deflection device such a glass wedge or prism (32) acts to remove or separate out an error beam (30) caused by leakage of light of one polarisation into the path of light of the other polarisatio...

Methods and systems for determining information about the incident angle of a beam are disclosed, the method including directing a beam having an s-polarized component and a p-polarized component to reflect from an interface at a non-normal angle, where the non-normal reflection introduces for each component a phase change upon reflection that is different for each component, and measuring an optical interference signal related to the phase change between the components of the reflected beam.

A first beam having high coherence and a second beam having low coherence are multiplexed onto the same optical axis. This multiplexed beam is split into first and second multiplexed beams. The first multiplexed beam is directed towards a measurement reflection plane of an object to be measured, and the second multiplexed beam is directed towards a reference plane. The first and second multiplexed beams that are reflected from the measurement reflection plane and the reference plane, respectivel...