Integrated circuit bus integrity may be verified without specialized test equipment. In a diagnostic mode, the integrated circuit may output a series of predetermined activation patterns onto the data bus to verify integrity of the data bus. Further bus verification may be provided by an address capture mode where address bus contents are reflected onto the data bus. A microprocessor may control diagnostic mode operation.

A built-in self-test circuit adapted to be embedded in an integrated circuit for testing the integrated circuit, including in particular a collection of addressable elements, for example a semiconductor memory. The BIST circuit comprises a general-purpose data processor programmable for executing a test program for testing the integrated circuit. The BIST circuit comprises an accelerator circuit cooperating with the general-purpose data processor for autonomously conducting operations on the int...

Aspects of the invention may include testing and debugging an embedded device under test. Testing and debugging and embedded device under test may include the step of loading an instruction into a parameterized shift register of each one of a plurality of BIST modules coupled to an individual one of a plurality of embedded memory modules comprising the embedded device under test. An identity of each of the instruction loaded into the parameterized shift register of each one of the plurality of B...

A computer program product that runs via a processor system for generating and/or analyzing traffic signals for testing at least parts of integrated-circuit-environments designed to handle traffic signals are provided with generic modules and specific module to increase the re-usability. The specific modules are designed for interfacing the computer program product with a protocol used in the integrated-circuit-environment, such as an Internet-Protocol or an Asynchronous-Transfer-Mode-Protocol o...

Linking addressable shadow port (LASP) and protocol allows addressing the LASP and configuring the connection of multiple Secondary Test Access Ports (TAPs) of the LASP using a single protocol or protocol bypass inputs. Multiple LASPs are cascaded and the connection of their secondary TAPs are configured using the LASP protocol or protocol bypass inputs.

An apparatus enables a high quality test to be carried out within a short time, without forcing a severe design limitation on the designer and without an expensive tester. The apparatus includes a pattern generator built in an integrated circuit to generate pseudo random patterns as test patterns. A plurality of shift registers are configured with sequential circuit elements inside said integrated circuit. An automatic test pattern generating unit generates ATPG patterns. A pattern modifier modi...

Linking addressable shadow port (LASP) and protocol allows addressing the LASP and configuring the connection of multiple Secondary Test Access Ports (TAPs) of the LASP using a single protocol or protocol bypass inputs. Multiple LASPs are cascaded and the connection of their secondary TAPs are configured using the LASP protocol or protocol bypass inputs.

A microcontroller comprising a central processing unit and a further fault processing unit suitable for performing validation of operations of said central processing unit. The further fault processing unit is external and different with respect to said central processing unit and said further fault processing unit comprises at least a module for performing validation of operations of said central processing unit and one or more modules suitable for performing validation of operations of other f...