A timing generating device, in which a period generator generates pulses the average period of which is equal to a preset period, at integral intervals of a reference clock period T, and provides fractional period data which indicates the phase difference between the above pulses and a pulse of the preset period for each of them. From a coarse delay circuit is yielded a pulse delayed behind the former pulse according to coarse delay data in a preset delay amount, which indicates a value greater ...

A state analysis section which loads first input data into a first data memory for each change in state of the data and a timing analysis section which loads second input data into a second data memory with a fixed period are provided. The loading intervals of the first input data are measured by a data interval measuring circuit and each measured data loading interval is stored in a data loading interval memory. When the first and second input data are detected to match preset data in first and...

A test pattern is supplied to the IC under test and a current corresponding to the power supply current of the IC is obtained from a current converter. A reference current reverse in polarity from the output current of the current converter is yielded from a reference current source. The output currents of the current converter and the reference current source are supplied to an integrating capacitor via first and second switches, respectively. The first and second switches are simultaneously tu...

A digital sine-wave generator, which includes at least one sine waveform memory, is read out by the output of a phase accumulator to generate a first digital sine wave, a second digital sine wave and a digital cosine wave. The first digital sine wave is converted by a D-A converter into an analog signal and then supplied to a measuring object. The output of the measuring object and the second digital sine wave are multiplied in a first multiplying type D-A converter, and the output of the measur...

A device for testing a memory into which data can be written in a flash mode, includes a buffer memory which has a storage capacity equal to that of the memory under test, and a pattern generator for generating an address and data for input into the buffer memory. A data register stores the same data as that which is written into the memory under test during its flash write. A multiplexer selects either one of the data stored in the data register and the data from the pattern generator, and prov...

A timing generator for generating arbitrarily delayed pulses, in which, upon each readout of period data from a period data memory, a computing section subtracts its accumulated value from delay data read out of a delay data memory, and upon inversion of the sign of the subtracted value, the immediately preceding subtracted value is provided to a delayed pulse generator, which generates a pulse at the timing corresponding to the subtracted value applied thereto.

In a memory testing device for testing a memory capable of effecting a write and a read in pixel, plane and block modes, there are provided a pattern generator for generating an address and data for supply to the memory under test and a buffer memory which has memory chips equal in number to the square of the number of bits of the data. The same data as that to be written in the memory under test is written in the buffer memory in the same mode as in the memory under test, and the data is read o...

In equipment which measures current of ICs for testing them, there are provided a first current detector for detecting current which flows through an IC under test when applying voltage from a voltage source to a power source terminal of the IC to which a smoothing capacitor is connected, a buffer amplifier for extracting the voltage to be applied to the power source terminal, a compensating capacitor which is supplied with the output of the buffer amplifier and provides a charging/discharging c...

A method for testing and measuring distortion in electrical devices is provided. For signal processing and carrying devices, a signal generator generates a signal having known phase, amplitude and frequency, which is provided both to a device under test and a measuring unit. The measuring unit measures the amplitude, frequency and phase rotation of an output of the device under test and provides these measured values to a suppression signal generator. The suppression signal generator generates a...

In a semiconductor test system, higher accuracy testing of semiconductor memories is achieved by providing test data from a modified pattern generator to identical addresses in both the memory under test and a buffer memory. This is achieved for various types of semiconductor memories by treating data generated by the modified pattern generator for the memory under tests in ways that would correspond to how the data is treated in various memories to be tested before storing the data in the buffe...