Disclosed are novel methods and apparatus for efficiently providing instruction-based BIST of memory interconnects. In an embodiment of the present invention, a method of testing a memory interconnect between an external memory module and a chip is disclosed. The method includes: providing an on-chip memory controller coupled to the external memory module, the on-chip memory controller sending and receiving data to and from the external memory module; providing an on-chip built-in self-test (BIS...

A semiconductor integrated circuit includes a memory which has redundant lines for repair in both a column direction and a row direction. A test pattern generating section generates a specific test pattern for the memory. A comparing section reads an output from the memory to judge whether or not a fault cell exists in the memory and outputs a signal which shows existence or nonexistence of a faulty cell. The circuit includes a first data storage section, which operates in a first test mode for ...

A loop-back extender card is plugged into a memory module socket on a personal computer (PC) motherboard. The extender card has a test socket that receives a memory module under test. An Advanced Memory Buffer (AMB) on the memory module fully buffers DRAM chips on the memory module. The AMB inputs from and outputs to the test socket differential northbound lanes (toward a processor) and southbound lanes (away from the processor). The extender card has northbound loopback traces that connect nort...

Today many instances of IEEE 1149.1 Tap domains are included in integrated circuits (ICs). While all TAP domains may be serially connected on a scan path that is accessible external to the IC, it is generally preferred to have selectivity on which Tap domain or Tap domains are accessed. Therefore Tap domain selection circuitry may be included in ICs and placed in the scan path along with the Tap domains. Ideally, the Tap domain selection circuitry should only be present in the scan path when it ...

An on-chip timing measurement circuit for improving skew measurement and timing parameter characterization in integrated logic circuits providing increased accuracy and range. The measurement circuit includes a chip delay element characterization circuit for determining chip specific delay values having one output connected to a second control input of the programmable delay generator and receiving an output from the programmable delay generator for providing a value corresponding to the measure...

Special test circuitry in an IC for wafer level testing selectively connects the specialized test circuitry to the functional circuitry during wafer test. Following wafer test the special test circuitry is electrically isolated from the functional circuitry and power supplies such that it does not load functional circuit signals nor consume power.

A data transmission apparatus for relaying data transmitted from the transmitting end in units of packets, each packet having additional information relating to its sequence number, priority and data reproduction time, comprises: a receiving unit for receiving packets transmitted from the transmitting end; a priority decision unit for deciding the priority of each of the received packets; a retransmission packet storage unit for storing packets the priorities of which are equal to or higher than...

Disclosed is a flexible command multiplication scheme for the built-in-self test (BIST) of a high-speed embedded memory array that segments BIST functionality into remote lower-speed executable instructions and local higher-speed executable instructions. A stand-alone BIST logic controller operates at a lower frequency and communicates with a command multiplier using a low-speed BIST instruction seed set. The command multiplier uses offset or directive registers to drive a logic unit or ALU to g...

An apparatus for testing an integrated circuit, the apparatus including a sequence control logic unit having an output channel connectable to a device under test, and a memory to store at least two types of data sets, each data set being used by the sequence control logic unit to determine a test pattern to output on the output channel.

A memory chip includes an on-chip data generator, a scrambler unit for checking the correct operability of the memory cells, a repair unit, and redundant word lines that, in the case of a memory cell recognized as defective, are used instead of the word line regularly activated. The scrambler unit is connected to the repair unit and, thus, receives from the repair unit information on whether the redundant word line replacing a defective word line drives transistors of memory cells that can be co...