A three-dimensional inspection system is used to obtain three-dimensional information pertaining to an article having specular surfaces, such as a BGA device, by projecting a pattern of light onto the article at an oblique angle with respect to the article. The system includes patterned light projector having an optical axis disposed at an oblique angle with respect to the plane of the article being inspected and an image detector or camera disposed generally above the article being inspected to...

A three-dimensional inspection system is used to obtain three-dimensional information pertaining to an article having specular surfaces, such as a BGA device, by projecting a pattern of light onto the article at an oblique angle with respect to the article. The system includes patterned light projector having an optical axis disposed at an oblique angle with respect to the plane of the article being inspected and an image detector or camera disposed generally above the article being inspected to...

The dimensions of a countersunk hole, or of a fastener head, are determined accurately and rapidly by a nondestructive measurement system. At least one laser projects spots of light onto the surface being analyzed. From knowledge of the projection angle, and of the lateral displacement of the spots of light caused by variations in the depth of the surface, one can calculate an actual depth of each point on the surface. A set of parameters defining a mathematical model of the hole or fastener hea...

An apparatus for determining the profile of an object provides a sensor having at least one light source which projects a sheet of light that is intersected by the object, whereby a stripe of points on the object are illuminated. The light source projects the sheet from multiple angles, so that the resulting stripe represents a continuous profile. The profile is collectively viewed by at least two optical detectors, which each have a different view than the others and provide an output signal re...

An optical metrology system for measuring a contour of a workpiece surface. The system includes a multi-wavelength light projector that projects a wavelength-varying collimated light beam onto the surface of the workpiece. The collimated light beam has a plurality of substantially parallel light rays, each of which has a predetermined wavelength. The wavelength of the plurality of light rays varies in a predetermined manner across a width of the collimated light beam. A wavelength-discriminating...

The invention disclosed herein relates to a detection system for a profile line on an observed body which uses a linear array of sequentially energized energy beam emitters to project beams toward the body. Reflections of the beams are detected by a linear array of energy beam receivers which monitor wedge shaped sectors within a field of view. The known sequence of beam projection and the known sector of reception of reflected beams are used to identify points in space on the profile line.

This invention comprises a sensor (40) having a slit-ray generator (41) and a camera (42), a calibration block (100) for calibrating 3-dimensional coordinate values, a computer (10) for processing 2-dimensional coordinate values of the calibration block (100) and the object (90) to obtain data of 3-dimensional space coordinate and output it to CRT (60), a robot hand (10) for moving the sensor (40) on multiple axes. Therefore, this invention can measure the section profile shape of a tire, etc. a...

The present invention is an optical system for profiling a surface of an object. The optical system includes a projection system for directing an incident beam of light having a varying intensity pattern onto the surface of the object. The projection system includes a filter or the like for reducing or attenuating high order harmonics from the varying intensity pattern. The varying intensity pattern of the incident light beam is spatially shifted N times, where N is greater than 2. A detector ar...

A method and an apparatus for dimensional measuring of objects of any form and depth. The apparatus comprises at least an illumination system (1) having an optical filter (4), a manipulator unit (5, 6), and an observation system having an optical filter (9). The optical filters (4, 9) are designed so that most of the light passing the object and not being influenced by the object is stopped. The manipulator unit is such that between measurements either the object is made to rotate about one or m...

A three-dimensional measuring apparatus including a multi-slit projector has an actuator for displacing at least one of first and second diffraction gratings by only a minute distance in a direction perpendicular to the slit lights. An image recognizing apparatus includes an image arithmetic unit for changing, each time a coded multi-slit light pattern is changed, weights assigned to the binarized image signals, and for summing up the last weighted binarized image signals or the image signals of...