An electric plug is disclosed which includes a detection circuit, which detects electric current and voltage and removes high frequency noises from power supply; an electric energy measuring and converting circuit, which receives detected signal from the detection circuit and outputs a corresponding electric energy signal; a microprocessor, which proceeds with electric energy signal processing, time counting and data storing processes according to the electric energy signal received from the ele...

A new method and system of testing and classifying semiconductor devices is provided. User requirements are collected for this purpose, test specifications and test functions are defined for the to be tested DRAM devices. The Automatic Classification Shipping (ACS) data base is updated with test related data, the testing is performed whereby DRAM devices are assigned categories from with DRAM classes are derived. These identified classes are used to sort the tested DRAM devices in accordance wit...

A method is provided for verifying insulation distances within electrical systems without producing actual system prototypes. A bounding box tree of each component is produced, and root node pairs are put into a queue. The distance between boxes corresponding to two nodes of the root node pair is calculated. If the distance is greater than a predetermined value, no further process is performed for this root node pair, however, if the distance is less than the predetermined value, triangular patc...

The invention provides a method for testing a circuit operation (circuit simulation), which is conducted by using a model of high precision. After parameters are extracted by using a model of which physical precision is low and parameter extraction time is short from measurement data, the parameters are converted to those obtained by a model of which parameter extraction time is generally long and a circuit operation test is performed by a model of high physical precision. In other words, a para...

A measuring device or test device is provided which includes several functional units that are interconnected. The functional units are interchangeable or can be added or omitted in a variable manner. The measuring or test device can be configured with functional units whose functional characteristics differ in terms of precision and/or quality and/or functional scope.

A measurement method is disclosed for measuring the resistance component leakage current. The signal waveform of at least one AC cycle is sampled in the resistance component leakage current measurement, and the resistance component leakage current is measured. A zero-cross detecting circuit for detecting a voltage zero-crossing point of the target measurement circuit and outputting a sampling start signal is provided, voltage digital data of the sine wave form whose effective value is 1 and the ...

An apparatus and method causes a response action in an electrical power distribution system having, inter alia, a plurality of intelligent electronic devices (IEDs) configured to provide protective monitoring and control of the electrical power system. The method includes detecting receipt of one of a number of matrix input signals that can be received from the plurality of IEDs, and comparing the matrix input signal to a configuration of a m.times.n cross-point switch matrix having a correspond...

A power quality analysis system includes a combination of at least one of a power quality parameter value, power quality event properties, non-power quality properties, and time properties. The parameter value and other properties is used to create power quality information that is descriptive of power quality events. The power quality information is easily configured and organized based on the desired options in order to make it more understandable and usable.

A computing system includes a semiconductor which sources/sinks current to/from components within the system, an in-circuit semiconductor on-resistance characterization circuit which measures the on-resistance of the semiconductor, and a processor which periodically or continuously engages the characterization circuit over the life of the semiconductor to obtain a series of on-resistance measurements. Depending on the type of semiconductor used, or depending on arbitrary design limitations, the ...

A method for inspecting a part is provided. The method includes applying a number of multifrequency excitation signals to a probe to generate a number of multifrequency response signals for the part being inspected. The method further includes performing a multifrequency phase analysis on the multifrequency response signals to inspect a subsurface of the part. An inspection system is provided and includes an eddy current (EC) probe configured to induce eddy currents in a part. The system further...