Aspects of the invention for testing and debugging an embedded device under test may include the step of loading an instruction into a parameterized shift register of a BIST module coupled to each one of a plurality of embedded memory modules comprising the embedded device under test. An identity of the loaded instruction may be determined subsequent to loading the instruction into the parameterized shift register. A plurality of test signals may be generated which correspond to the determined i...

In a JTAG test and debug environment, the parameters that are accessed by command include a delay parameter. The delay parameter prevents the subsequent command from being executed until both the original command has been executed and the clock cycles indicated by the delay parameter have been completed. Because the time delay is included as a parameter identified by the command, the delay parameter can be programmed.

According to one embodiment of the invention, a method of accessing instruction data from a memory comprises steps of specifying a predetermined address of a memory for storing instruction data; writing instruction data to the predetermined address in the memory; reading the instruction data from the predetermined address after the step of writing instruction data; and determining whether the instruction data is valid. According to another embodiment of the invention, a method describes a method...

A circuit having a corresponding method comprises one or more circuits each to produce one or more status signals, wherein each of the status signals represents a status of a respective one of the one or more circuits; a memory; a memory controller to store a plurality of samples of the one or more status signals in the memory; a plurality of input/output terminals; an interface in communication with one or more of the input/output terminals; and a debug circuit to transfer the one or more sampl...

A diagnostic tracing logger is presented for use in a multithread environment in which diagnostic trace log entries are captured and recorded. The trace logs are composed of sequences of memory addresses used to access instructions and operands, instruction op-codes and register specifiers, sequences of memory addresses, branch instructions or exceptions, the contents of registers or semiconductor memory locations, and the like. In one embodiment, a software module configures a plurality of buff...

A system for on-chip testing of embedded memories using Address Space Identifier (ASI) bus in Scalable Processor ARChitecture (SPARC) microprocessors. An integrated circuit includes a plurality of memory arrays, Address Space Identifier (ASI) bus interface logic connected by an ASI bus to the plurality of memory arrays, and a memory control unit and a memory built-in self-test (MBIST) engine connected to the ASI bus interface logic. Rather than direct access, the MBIST engine utilizes the ASI bu...

A data processing device including a semiconductor chip, an electronic processor on-chip and an on-chip condition sensor connected to the electronic processor for analysis of the operations.

JTAG operations are carried out remotely over a network interface. The host processor includes a JTAG interpreter and a host side JTAG driver. A target device includes a target side JTAG driver. The interpreter processes and translates JTAG design files. The host side JTAG driver generates messages for the target side JTAG driver based on the translation. The host JTAG driver delivers the messages to a host network interface. The host network interface is connected via a network link to a target...

A testing system evaluates one or more integrated circuit chips using RF communication. The system includes an interrogator unit with a radio communication range, and an IC chip adapted with RF circuitry positioned remotely from the interrogator unit, but within the radio communication range. The interrogator unit transmits a power signal to energize the IC chip during test procedures, and interrogating information for evaluating the operation of the IC chip. Test results are transmitted by the ...

A memory hub includes an on-board diagnostic engine through which diagnostic testing and evaluation of the memory system can be performed. The memory hub includes a link interface for receiving memory requests for access to memory devices of the memory system and a memory device interface coupled to the memory devices for coupling memory requests to the memory devices. A memory hub diagnostic engine is coupled through a switch to the link interface and the memory device interface to perform diag...