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Results for INVENTOR: bockhaus john w.
Showing 1 - 7 of 7
A method and structure facilitates the debugging and test coverage capabilities of a microprocessor. A microprocessor having memory arrays, a debug block, and one or more built-in-self-test (BIST) engines is disclosed. The debug block is capable of driving control information out onto a state machine output bus in response to an event and the control information can be selectively used to control signature analysis or recording elements of the microprcessor, such as multiple-input-shift-register...
An embodiment of the invention provides a circuit and method for reducing power in multi-way set associative arrays. A control circuit detects when the next cache access will be taken from the same cache way that the previous cache access was taken from. If the next cache access is taken from the same cache way as the previous cache access, the control circuit signals all the cache ways, except the cache way that was previously accessed, to not access information from their arrays. The control c...
Disclosed are systems and methods providing a unified system fabric in a computer. The systems and methods of embodiments including first interface disposed between a first component of the computer system and a second component of the computer system, the first interface implementing an interface protocol, and a second interface disposed between the first component of the computer system and a third component of the computer system, the second interface implementing the interface protocol, wher...
A method and apparatus is disclosed for reading data from and writing data to remote registers that are dispersed throughout an integrated circuit chip. Regardless of the size or number of remote registers involved, the operation is accomplished using only two interconnect lines, plus a clock. Each remote register is associated with a unique address. During a write operation, a microprocessor loads the write data into a staging register, loads the destination address into a header generation reg...
Circuitry for detecting signal patterns on a multi-bit bus. First comparison circuitry monitors a first portion of the bus comparing it with a first expected signal pattern, generating a first comparison output. Second comparison circuitry monitors a second portion of the bus comparing it with a second expected signal pattern, generating a second comparison output. Both comparison outputs are applied to an AND gate and a first OR gate. One data input of a multiplexer is coupled to the output of ...
Circuitry for providing external access to signals that are internal to an integrated circuit chip package. A plurality of N:1 multiplexers are physically distributed throughout the integrated circuit die. Each of the multiplexers has its N inputs coupled to a nearby set of N nodes within the integrated circuit, and each of the multiplexers is coupled to a source of select information operable to select one node from the set of N nodes for external access. Each of the multiplexers has its output...
User-configurable diagnostic hardware contained on-chip with a microprocessor for the purpose of debugging and monitoring the performance of the microprocessor. Method for using the same. A programmable state machine is coupled to on-chip and off-chip input sources. The state machine may be programmed to look for signal patterns presented by the input sources, and to respond to the occurrence of a defined pattern (or sequence of defined patterns) by driving certain control information onto a sta...
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