An image defect correction apparatus that processes luminance signals output from two-dimensionally arranged light-sensitive elements via a plurality of vertical charge coupled devices and a horizontal charge coupled device in a predetermined order, outputs image information, and includes: a recording unit that records therein an X address for identifying a correction-target vertical line of pixels corresponding to a vertical charge coupled device in which a point defect exists; a correction val...

A solid state imaging device of the present invention comprises a solid state imaging element which includes a plurality of photoelectric conversion elements arranged in a matrix. In the solid state imaging device of the present invention, a pixel mixture unit area includes q pixels (q is a natural number equal to or greater than 2) in the first direction of the solid state imaging element and p pixels (p is a natural number equal to or greater than 2) in the second direction that crosses the fi...

A solid state image sensor comprising a matrix of photosensitive elements adapted to accumulate signal charges corresponding to at least two different aspect ratios, a plurality of vertical shift registers disposed adjacent to columns of the photosensitive elements for a vertical transfer of the signal charges and a plurality of horizontal shift registers corresponding to the respective aspect ratios and disposed in parallel with each other for a horizontal transfer of the signal charges from th...

The solid state image sensor of the invention comprises a plurality of photosensitive elements arranged in a matrix form, a vertical shift register disposed adjacent each column of the photosensitive elements and adapted to vertically transfer signal charges read from the corresponding photosensitive elements, a storage region for storing signal charges transferred by the vertical shift register and a horizontal shift register adapted to horizontally transfer signal charges read from the storage...