The invention provides an apparatus for measuring the physical properties of a sample by optically monitoring the response of the sample to illumination by ultrashort optical pulses. The apparatus is a common path optical interferometer of a Sagnac type that can measure physical properties at normal incidence, i.e., a single-arm Sagnac interferometer featuring two beam splitters. Measurement is performed in such a manner that a sample is excited by a beam of ultrashort optical pulses, and variat...

The invention provides an apparatus for measuring the physical properties of a sample by optically monitoring the response of the sample to illumination by ultrashort optical pulses. The apparatus is a common path optical interferometer of a Sagnac type that can measure physical properties at normal incidence. The interferometer is a two-arm Sagnac interferometer featuring two beam splitters. Measurement is performed in such a manner that a sample is excited by a beam of ultrashort optical pulse...

An apparatus for measuring the physical properties of a sample by optically monitoring the response of the sample to illumination by ultrashort optical pulses utilizes a common path optical interferometer of a Sagnac type that can measure physical properties at normal incidence. The interferometer is a two-arm Sagnac interferometer featuring three beam splitters. A sample is excited by a beam of ultrashort optical pulses, and variations in intensity and phase of another optical beam are detected...