A wheel and overlay assembly employing an overlay configured to more fully control the aesthetic appearance of the assembly. The wheel and overlay assembly employs an overlay that more completely establishes the decorative appearance of the assembly, thereby enabling the use of a standardized wheel whose design and construction considerations are based almost solely on the structural requirements of the assembly. As such, the overlay is adapted to enable the functions of structural integrity and...

The present invention is a method and apparatus that uses a microscopic height variation positioned relative to a semiconductor device to scan a target on the device to produce an electrical signal representative of height variations of first and second periodic structures of the target in a selected path across the device, and a computing and control system to provide translation between the microscopic height variation detector and the target on the device in a selected path, and to calculate ...

An apparatus and method for depositing an overlay material onto a metal surface. An electroslag strip overlaying process which distributes flux through a trailing flux tube and a forward flux tube eliminates many of the problems associated with electroslag overlaying techniques. The apparatus and method significantly improves the quality of the overlay surface, and permits overlays to be made within the small confines of pipes and pipe fittings having straight or curved surfaces.

Disclosed is an overlay accuracy measurement mark used in measuring an overlay accuracy between any two selected device patterns in a semiconductor device having two or more multi-patterns. The mark is applied to a semiconductor device comprising a first pattern which is first formed, and second patterns consisting of at least one or more target patterns for alignment with the first pattern, which are formed after the formation of the first pattern. The mark includes a first overlay measurement ...

The present invention is a new target, and associated apparatus and methods, for determining offset between adjacent layers of a semiconductor device. The target disclosed here includes a first periodic structure to be placed on a first layer of the device and a second periodic structure, that complements the first periodic structure, placed on a second layer of the device at a location that is adjacent the first periodic structure when the second layer is placed on the first layer. Any offset t...

A system for converting graphic symbols on a computer data entry keyboard to another set of graphic symbols such as a foreign language or scientific symbols or mathematical notations is disclosed. The system comprises a plurality of individual keycaps, each keycap being sized for fitting over the upper surface of a single data entry key on the computer data entry keyboard. Each keycap has two indicia inscribed thereon. The first indicia, corresponding to the graphic symbol to be displayed upon t...

A brush overlay Pap smear method is provided for providing a single cytological sample representing specimens for two or more sites. An exocervical sample (20) is transferred from a scraper (40) to an end portion (16) of a surface (14) of a microscope slide (10). Subsequently, an endocervical sample is combined with the exocervical sample (20) and distributed across the surface (14) of slide (10) to provide a substantially uniform distribution of the combined samples into a substantially uniform...

A method of applying a welded overlay to the interior surface of curved hollow articles such as 90 degree elbows utilizing a submerged arc welding gun curved to follow the radius of the hollow article and comprised of an elongated cylindrical body (27) and a curved weld head (10), welding tip holder (24) and welding tip (28) and incorporating a flux conveying system (16), (18) and (20) and a plurality of air release slots (22) by which the flow of flux to the weld area is controlled. A first ser...

An overlay apparatus for use in a conveyor belt which extends in a first direction and which includes a plurality of transverse rods extending between opposed edges of the belt. The overlay apparatus includes an overlay body bent at regularly spaced intervals to form a sinuous configuration with generally straight interior portions extending from respective curved end portions. The overlay body is bent so that the curved end portions thereof are aligned along a pair of spaced generally parallel ...

An apparatus having a signal conducting line with first and second ends is provided. The signal conducting line is configured to allow changes of impedance at space locations therealong. The signal conducting line is supported by a substrate. A signal generator is operably connected to the first end of the signal conducting line, the signal generator generating a measuring signal along the signal conducting line. The measuring signal has a predetermined characteristic, over a plurality of time i...