In a normal operation, a shift mode signal (SM) is set to "0" to propagate signals applied to "0"-input ends of selectors (10 to 12), i.e., outputs of a logic unit (80). In a logic scan test on logic units (80, 81), by setting a test-mode signal to "1", an ordinary scan test is performed with a scan path of simple configuration, having bits as much as write data and employing scan flip flops consisting of pairs of selectors (10 to 12) and flip flops (30 to 32) respectively. The flip flops used f...

A test contactor for establishing a releasable connection between terminals of an integrated circuit electronic module to be tested and a circuit board connected to test equipment includes a housing carrying a contact element for each terminal of the module. Each contact element includes a contact surface which is engaged by the corresponding terminal of the modules when testing is effected. The contact surface is connected to a pad which connects the contact element to the circuit board by a sp...

A test fixture for testing circuit boards has a vacuum chamber between a stationary probe plate and a movable top plate. Separate adjustable linear bearings located in quadrants of the fixture provide parallel alignment between the top plate and the probe plate. A continuous vacuum seal between the probe plate and top plate bypasses the bearings so the bearings are outside the vacuum area. Spring loaded test probes in the probe plate extend through holes in the top plate for access to a circuit ...

The operative site of an assay device is dosed with a controlled volume of a liquid specimen by a holding device which holds the controlled volume of specimen in contact with the operative site, although the holding device remains out of contact with the operative site. A sink device is in contact with the margin of the holding device and moves excess specimen away from the holding device. In one embodiment the device makes possible a non-wipe teststrip architecture. The device can be used in th...

The present invention relates to means and methods for testing microelectronic parts and devices including a special fixture that provides a stable support for holding packaged integrated circuit boards and the like at a specially selected angle in an environmental or humidity testing chamber. A plurality of holes are defined into a sloping surface of a plastic block, into which magnets are strategically placed to define a preselected pattern. Packaged parts are then placed on the magnets and se...

A test connector for connection to two test inputs of a trip device. The test connector includes a fixed component made of electrically insulating material, wherein the fixed component includes a sleeve defining an inner space. A movable component is provided within the inner space and is axially movable therein. The movable component includes a protruding portion which extends from the fixed component. A spring is provided between the movable component and the fixed component to provide a biasi...

An apparatus is provided for testing both the integrity and the functionality of the electrical circuit tracings on a printed circuit board. The apparatus is a bed-of-nails test fixture. The device has a plurality of parallel test probes affixed to the bottom plate of the fixture. The plurality of test probes consists of a plurality of short probe members and a plurality of long probe members. The height of the long probe members is telescopically alterable between the height of the short probe ...

Method and an apparatus for measuring the development parameter of a light-sensitive fluid in a white-light environment. The apparatus comprises first and second flexible light-impervious sheets superimposed and sealed together to form a pouch containing a plurality of chambers having flow paths therebetween, wherein the chambers are sealed with burstable seals allowing fluid communication between the chambers upon the application of a predetermined pressure.

The present invention is a method for diagnosing a patient at risk to thrombocytopenia induced by administration of a GP IIb/IIIa receptor antagonist, which comprises combining i) a plasma sample of the patient; ii) detectable monoclonal antibody which recognizes induced binding sites formed on the GP IIb/IIIa receptor following association of a fibrinogen receptor antagonist with the GP IIb/IIIa receptor; and iii) GP IIb/IIIa receptor:GP IIb/III receptor antagonist complex, and determining asso...

A test socket for an integrated circuit package having an upper housing and a lower housing secured to the top and bottom surfaces, respectively, of a load board. The upper housing having a cavity for receipt of the integrated circuit package and including a hole in the base of the upper housing to allow a plurality of solid socket plungers to contact test sites on the integrated circuit package. The socket plungers are positioned within a plurality of channels formed in the lower housing and ex...