
Here is provided a testing apparatus for judging whether or not a device-under-test is defect-free based on static power-supply current of the device-under-test, having a power supply for supplying power for driving the device-under-test to the device-under-test, a pattern generating section for supplying setting vectors for setting a circuit of the device-under-test into a predetermined state to the device-under-test, a power-supply current measuring section for measuring the static power-suppl...











