Abstract of
JP9331554
PROBLEM TO BE SOLVED: To realize a semiconductor device such as a frame memory whose test and diagnosis are efficiently executed, to reduce a development period for a video capture system or the like including the frame memory and to reduce the cost. SOLUTION: When a prescribed test diagnosis mode is designated by mode selection signals M0D0, M0D1 in a frame memory FLM1 incorporating address counters WADC, RADC to designate sequentially and automonously a read address or a write address to be mounted on a video capture board of a video capture system, the count value of the address counters WADC, RADC is outputted serially from an external terminal WAD or RAD to set an initial value for example, or outputted in parallel from data output terminals Dout0- Dout7 to provide an output of read data of a memory array section MARY. Thus, without giving hindrance to the usual operation, the count value at an optional point of time of the address counters WADC, RADC is identified externally.
