or
 
 
 
Examiner index starting from letter ALL
Showing 271 – 300 of 27717
Search for Examiner:
Examiner’s last name from A to Z:  
All A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
Examiner name
Quantity of Patents
Pham; Chi 2601
Haroian; Harry N. 2600
Bucci; David A. 2599
Fourson; George 2598
Rolla; Joseph J. 2595
Higel; Floyd D. 2589
Bagnell; David 2581
Morano; S. Joseph 2578
Hille; Rolf 2575
Wright; Dirk 2573
Padgett; Benjamin R. 2568
Smith; Al Lawrence 2559
Hall; George T. 2556
Ng; Jin F. 2552
Weidenfeld; Gil 2547
Wolff; John H. 2544
Metjahic; Safet 2534
Rizzo; Nicholas S. 2529
Tupper; Robert S. 2523
Friedman; Stanley J. 2523
Will; Thomas B. 2522
Smith; James G. 2515
Calvert; John J. 2515
Bleutge; John C. 2515
Focarino; Margaret A. 2507
Tollberg; Stanley H. 2505
Lee; Mary C. 2503
Werner; Frank E. 2502
Murtagh; John E. 2499
Berch; Mark L. 2492
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